Both for material spectroscopy and EIS, the measured spectra are further processed with special procedures depending on the sample type. Generally, material specific models are matched by non linear curve fitting procedures to the measured data. As the models may include results from other material characterization methods, a link between the several techniques can be established in order to get more general information. With modern equipment , they can be accurately and automatically determined from some mHz up to several GHz 15 decades for nearly all kind of materials.
Sample preparation requires only little effort. Equipment costs are low compared to other material analysis methods. The combination of these features make the methods of dielectric spectroscopy, conductivity spectroscopy, and electrochemical impedance spectroscopy both powerful and valuable tools, especially since electrical materials properties are of particular interest both for fundamental and application-oriented research.
The method is applied by different scientific communities to various kinds of materials and problems. Although the principle of measurement is always the same, researchers, materials, underlying theories, models and equipment requirements may be quite different.
Instead most often special systems are used made up by an dielectric converter unit and a following frequency response analyzer FRA or lock-in amplifier. This system is obsolete and was replaced by the Alpha analyzer , which extends the performance in many aspects at lower price. The dielectric converter is a wide band electrometer amplifier which transforms the sample current into a voltage which is phase sensitive measured by the FRA or lock-in.
For high phase accuracy, each sample measurement point is compared with a low loss reference capacitor. Somewhat conductive samples outside the range of the reference capacitor can still be measured within the system's impedance range.
Moreover, the Alpha analyzer offers about one order of magnitude improved phase accuracy. As the measurement system is made up by two independent devices dielectric converter and FRA or lock-in amplifier , they have to be controlled by a host computer which runs a special software.
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